High brightness portable four point probe method slice resistivity meter

Supplier: Suzhou Jingge Electronics Co., Ltd.
Region: Jiangsu, China
Contact: Mr Hailong Ding
Price: $569.50 /set
Min. Order: 1 set

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Product details

Accuracy:	0.5%;	Usage:	Test Sheet Resistance;
Display Type:	Digital Only;	Brand:	JG;
Brand Name:	JG;	Operating Temperature:	0℃~40℃;
Resolution:	0.001;	Selling Units:	Single item;
Model Number:	M-3;	Product Name:	portable four point probe method slice resistivity meter;
Measuring Method:	Four Probe Method;	Dimensions:	21cm10cm3.6cm;
Weight:	1kg;	Measuring Range:	200mOhm-20kOhm;
Packaging Detail:	High brightness portable four-point probe method slice resistance meter and accessories are packed in carton;	Place of Origin:	Jiangsu China;
Package Preview:	;	Model:	M-3;
Resistance Test Range:	200mOhm-20kOhm;	Single package size:	28.5X23.5X9.5 cm;
Testing Voltage:	5V,12V;	Display:	Digital Display;
Single gross weight:	1.0 KG;	Accuracy Class:	0.5%;

High brightness portable four point probe method slice resistivity meter

Product Description

M3 is a multi-purpose, cost-effective measuring instrument that uses the four-probe measurement principle to test material resistivity / square resistance.

Basic parameters

Specification model	M-3
resistance range	0.010Ω to 50.00kΩ
resistivity range	0.010Ω-cm~20.00kΩ-cm
Square resistance range	0.050Ω/◊ to 100.00kΩ/◊
resolution	0.001Ω~10Ω
LED display	Resistivity. resistance. Square resistance test. thickness.Correction factor
Test mode	single electrical measurement
Error	0.5%(standard samples)
Choose to buy	1.square probe 2.linear probe
	Tungsten carbide probe: Φ0.5mm, linear probe spacing 1.0mm, probe pressure: 0~2kg adjustable
	gilded copper hemispherical probe: Φ0.7mm, linear or square probe spacing 2.0mm, probe pressure: 0~0.6kg adjustable
Measurement orientation	Axial and radial
interface	USB
range	5 gear
Working power	220V(110V)±10%, f=50Hz±4%,Pw≤20W

Widely used: Sheet Resistance Tester

1. Cover film; conductive polymer film, high and low temperature electric heating film; heat insulation, conductive window film conductive (shield) cloth, decorative film, decorative paper; metallized label, alloy foil film; smelting, sintering, sputtering, Coating, coating layer, resistive, capacitive touch screen film; electrode coating, other semiconductor materials, film material square resistance test.

2. Silicon ingot, wafer resistivity and diffusion layer, epitaxial layer, ITO conductive foil film, conductive rubber, etc., material resistance, semiconductor material/wafer, solar cell, electronic component, conductive film (ITO conductive film glass, etc.), Metal film, conductive paint film, evaporated aluminum film, PCB copper foil film.

3. Thin layer resistance and electrical resistivity of materials such as EMI coatings Conductive paints, conductive pastes, conductive plastics, conductive rubbers, conductive films, metal films,

4. Antistatic materials, EMI protective materials, conductive fibers, conductive ceramics, etc.

Material size (determined by probe head bracket SZT-C)

Diameter: 180mm*180mm, unlimited handheld probes;

Length (height): H≤100mm, unlimited handheld probes.

Measurement orientation: axial and radial

Reference standard:

GB / T 1551-2009 "Determination method of silicon single crystal resistivity"

GB / T 1552-1995 "Four-Probe Method for Measuring Resistivity of Silicon and Germanium Single Crystal"